Improvements in mapping and microanalysis by FEG-EPMA

Microscopy and Microanalysis

Volumn 12, Issue SUPPL. 2, 2006, Pages 1378-1379

  MacRae, C M ^a   Wilson, N C ^a   Notoya, S ^b  

^a CSIRO   (Australia)

^b JEOL LTD   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 33750880371     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927606063124     Document Type: Conference Paper

References (5)

1. T. Schulein and R. Terborg, Microsc. Microanaly. (2004) 11, 460CD
2. MacRae et al. Microscopy Research and Technique, (2005), vol. 67, number 5, pp 271-277
3. P. Kotula et al., Microsc. Microanaly. (2003) 9, 1
4. N. C. Wilson, et al., The 16th Australian conference on Electron Microscopy, Canberra, (2000), 46
5. N.C. Wilson and C.M. MacRae, Microsc. Microanaly. (2005) 11, 434CD