A TEM study of wet oxidation of InAlP on GaAs

Microscopy and Microanalysis

Volumn 12, Issue SUPPL. 2, 2006, Pages 1082-1083

  Zhang, J ^a   Cao, Y ^a   Kosel, T H ^a   Cook, R E ^b   Hall, D C ^a  

^a University of Notre Dame   (United States)

^b ARGONNE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 33750874318     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927606065172     Document Type: Conference Paper

References (4)

1. X. Li et al., IEEE Elect. Dev. Lett. 25 (2004) 772-774.
2. Y. Cao et al., Appl. Phys. Lett. 86, 062105 (2005).
3. M.J. Graham et al., J. Corrosion Science and Engr. 6 (2003) paper H015.
4. This research was supported by AFOSR grant AF-F49620-01-1-0331, and U.S. DOE contract W-31-109-Eng-38 (for work done at Argonne National Laboratory).