Monitoring microstructure evolution in TiAl using TEM

Microscopy and Microanalysis

Volumn 12, Issue SUPPL. 2, 2006, Pages 1032-1033

  Novoselova, T ^a   Malinov, S ^b   Sha, W ^b   Rong, T S ^c  

^a UNIVERSITY OF LIVERPOOL   (United Kingdom)

^b QUEEN'S UNIVERSITY BELFAST   (United Kingdom)

^c UNIVERSITY OF BIRMINGHAM   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 33750873318     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S143192760606106X     Document Type: Conference Paper

References (5)

1. W.Z. Chen, X.P. Song, K.W. Qian, H.C. Gu, Mater Sci Eng A 1998, 247, 126-134.
2. C.T. Liu, J.H. Schneibel, P.J. Maziasz, J.L. Wright, D.S. Easton, Intermetallics 1996, 4, 429-440.
3. B.J. Inkson, H. Clemens, J. Marien, Scripta Mater 1998, 38, 1377-1382.
4. D.M. Dimiduk, P.M. Hazzledine, T.A. Parthasarathy, S. Seshagiri, M.G. Mendiratta, Metall Mater Trans A 1998, 29A, 37-47.
5. A. Gupta, J.M.K. Wiezorek, Intermetallics 2003, 11, 589-600.