Circumferential FIB milling for lift-out specimens

Microscopy and Microanalysis

Volumn 12, Issue SUPPL. 2, 2006, Pages 1310-1311

  Giannuzzi, Lucille A ^a   Anzalone, Paul A ^a   Young, Richard J ^a   Phifer, Daniel W ^a  

^a Thermo Fisher Scientific   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 33750870051     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927606065317     Document Type: Conference Paper

References (5)

1. Stevie et al., Surface Interface Analysis, 31 (2001) 345.
2. Ferryman et al., Surface and Interface Analysis, 33 (2002) 907.
3. Giannuzzi, Microscopy Today, 12 (2004)
4. Giannuzzi et al., Tech. Proc. 2005 NSTI Nanotechnology Conference and Trade Show, Vol. 2, (2005) 683.
5. Giannuzzi, Anzalone, Young and Phifer, patent pending, (2006).