Improvement of the morphological stability of Ag film on (001)Si with a thin interposing Au layer

Journal of Materials Research

Volumn 13, Issue 1, 1998, Pages 90-93

  Peng, Y C ^a   Chen, C R ^a   Chen, L J ^a  

^a NATIONAL TSING HUA UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; DEPOSITION; GOLD; INTERFACES (MATERIALS); INTERFACIAL ENERGY; METALLIC FILMS; SEMICONDUCTING SILICON; SILVER; VACUUM APPLICATIONS;

INTERFACE ENERGY; MORPHOLOGICAL STABILITY; ULTRAHIGH VACUUM DEPOSITION;

MORPHOLOGY;

EID: 0031676398     PISSN: 08842914     EISSN: None     Source Type: Journal    
DOI: 10.1557/JMR.1998.0014     Document Type: Article

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