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Volumn 91, Issue 2-3, 2007, Pages 167-173

Investigation of the degradation of a thin-film hydrogenated amorphous silicon photovoltaic module

Author keywords

a Si:H; Degradation; EVA encapsulant; Failure analysis; Photovoltaic modules

Indexed keywords

AMORPHOUS SILICON; FAILURE ANALYSIS; SCANNING ELECTRON MICROSCOPY; THERMOGRAVIMETRIC ANALYSIS; THIN FILMS;

EID: 33750690531     PISSN: 09270248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.solmat.2006.08.001     Document Type: Article
Times cited : (23)

References (12)
  • 3
    • 0002913650 scopus 로고    scopus 로고
    • E.E. van Dyk, E.L. Meyer, in: Proceedings of the 28th IEEE Photovoltaic Specialist Conference, IEEE Press, New York, 2000, p. 1525.
  • 5
    • 33750738409 scopus 로고    scopus 로고
    • D. Carlson, R. Romero, F. Willing, D. Meakin, L. Gonzalez, R. Murphy, M. Al-Jassim, in: Proceedings of NCPV and Solar Program Review Meeting, American Institute of Physics, New York, 2003, p. 946.
  • 7
    • 0004209522 scopus 로고
    • George Newnes Ltd., London
    • Shreir L.L. Corrosion (1963), George Newnes Ltd., London
    • (1963) Corrosion
    • Shreir, L.L.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.