Frustrated smectic layer structures in bent-shaped dimer liquid crystals studied by x-ray microbeam diffraction

Physical Review E - Statistical, Nonlinear, and Soft Matter Physics

Volumn 74, Issue 5, 2006, Pages

  Takanishi, Yoichi ^a   Toshimitsu, Megumi ^a   Nakata, Michi ^a   Takada, Naoki ^a   Izumi, Tatsuya ^a   Ishikawa, Ken ^a   Takezoe, Hideo ^a   Watanabe, Junji ^a   Takahashi, Yumiko ^b   Iida, Atsuo ^c  

^a TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

^b NIHON UNIVERSITY   (Japan)

^c INSTITUTE OF MATERIALS STRUCTURE SCIENCE   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ANTIFERROELECTRIC MATERIALS; DIMERS; ELECTRIC FIELD EFFECTS; MOLECULAR STRUCTURE; OLEFINS; X RAY DIFFRACTION ANALYSIS;

ALKYLENE SPACER; LAYER STRUCTURES; TERMINAL CHAIN LENGTH; X-RAY MICROBEAM DIFFRACTION;

LIQUID CRYSTALS;

EID: 33750682680     PISSN: 15393755     EISSN: 15502376     Source Type: Journal    
DOI: 10.1103/PhysRevE.74.051703     Document Type: Article

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