Characterization of the local layer structure of a broad wall in a surface stabilized ferroelectric liquid crystal using synchrotron X-ray micro-diffraction

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 35, Issue 1 A, 1996, Pages 160-167

  Iida, Atsuo ^a   Noma, Takashi ^b   Miyata, Hirokatsu ^b  

^a HIGH ENERGY ACCELERATOR RESEARCH ORGANIZATION KEK   (Japan)

^b CANON INC   (Japan)

Author keywords

Broad wall; Ferroelectric liquid crystal; Layer structure; Liquid crystal; Surface stabilized ferroelectric liquid crystal; Synchrotron radiation; X ray micro diffraction; X ray microbeam; Zig zag defect

Indexed keywords

CHARACTERIZATION; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; FERROELECTRIC MATERIALS; SYNCHROTRON RADIATION; TEMPERATURE MEASUREMENT; THERMAL EFFECTS; X RAY DIFFRACTION;

BROAD WALL; CHEVRON STRUCTURE; FERROELECTRIC LIQUID CRYSTALS; LOCAL LAYER STRUCTURE; X RAY MICROBEAM; X RAY MICRODIFFRACTION; ZIGZAG DEFECT;

LIQUID CRYSTALS;

EID: 0029733379     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/JJAP.35.160     Document Type: Article

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