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Volumn 294-296, Issue , 1999, Pages 227-230

Relative stability of two structures of the Σ=11 〈011〉 tilt grain boundary in silicon and germanium by the tight-binding method

Author keywords

Atomic Structure; Germanium; O(N) Method; Semi Empirical Tight Binding; Silicon; Stability; Tilt Grain Boundary

Indexed keywords


EID: 33750653252     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: None     Document Type: Article
Times cited : (1)

References (16)
  • 8
    • 0346320663 scopus 로고    scopus 로고
    • Interface Science and Materials Interconnection
    • ed. by the Japan Institute of Metals
    • B. Lebouvier, A. Hairie, F. Hairie, G. Nouet and E. Paumier, Interface Science and Materials Interconnection, Proceeding of JIMIS 8 ed. by the Japan Institute of Metals (1996) 299.
    • (1996) Proceeding of JIMIS 8 , pp. 299
    • Lebouvier, B.1    Hairie, A.2    Hairie, F.3    Nouet, G.4    Paumier, E.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.