Measurement of zone plate efficiencies in the extreme ultraviolet and applications to radiation monitors for absolute spectral emission

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 6317, Issue , 2006, Pages

  Seely, John ^a   Holland, Glenn ^b   Bremer, James C ^c   Zukowski, Tim ^c   Feser, Michael ^d   Feng, Yan ^d   Kjornrattanawanich, Benjawan ^e   Goray, Leonid ^f  

^a NAVAL RESEARCH LABORATORY   (United States)

^b SFA INC   (United States)

^c NORTHROP GRUMMAN CORPORATION   (United States)

^d XRADIA INC   (United States)

^e BROOKHAVEN NATIONAL LABORATORY   (United States)

^f Intl Intellectual Group Inc   (United States)

Author keywords

Diffraction; Extreme ultraviolet; Fresnel zone plate; Solar monitor

Indexed keywords

EXTREME ULTRAVIOLET; FRESNEL ZONE PLATES; RADIATION BEAMS; SOLAR MONITORS;

CMOS INTEGRATED CIRCUITS; PHOSPHATE COATINGS; SENSORS; SILICON COMPOUNDS; SPECTRUM ANALYSIS; SYNCHROTRON RADIATION;

DIFFRACTION GRATINGS;

EID: 33750603870     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.678142     Document Type: Conference Paper

References (6)

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2. J. C. Bremer and W. Yun, "Concept for an extreme ultraviolet sensor with a Fresnel zone plate for the GOES-R Solar Imaging Suite," SPIE vol. 5901, 59010P1-12 (2005).
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6. Leonid Goray, www.pcgrate.com