Effects of a controlled over-pressure process on the critical current properties in Bi-2223 tapes

Superconductor Science and Technology

Volumn 19, Issue 11, 2006, Pages 1110-1117

  Matsushita, Teruo ^a   Himeda, Yoshiko ^a   Kiuchi, Masaru ^a   Fujikami, Jun ^b   Hayashi, Kazuhiko ^b   Sato, Ken Ichi ^b  

^a KYUSHU INSTITUTE OF TECHNOLOGY   (Japan)

^b SUMITOMO ELECTRIC INDUSTRIES LTD   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); HEAT TREATMENT; MAGNETIC FLUX; MATHEMATICAL MODELS; SEMICONDUCTING BISMUTH COMPOUNDS;

CONTROLLED OVER-PRESSURE (CT-OP) PROCESS; CREEP-FLOW MODELS; CRITICAL CURRENT PROPERTIES; SILVER-SHEATHED TAPES;

SUPERCONDUCTING TAPES;

EID: 33750594916     PISSN: 09532048     EISSN: 13616668     Source Type: Journal    
DOI: 10.1088/0953-2048/19/11/004     Document Type: Article

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