Characterization of critical current density in silver-sheathed Bi-2223 tape

IEEE Transactions on Applied Superconductivity

Volumn 15, Issue 2 PART III, 2005, Pages 2518-2521

  Matsushita, Teruo ^a   Himeda, Yoshiko ^a   Kiuchi, Masaru ^a   Fujikami, Jun ^b   Hayashi, Kazuhiko ^b  

^a KYUSHU INSTITUTE OF TECHNOLOGY   (Japan)

^b SUMITOMO ELECTRIC INDUSTRIES LTD   (Japan)

Author keywords

Bi 2223 tape; Critical current density; Irreversibility field; n value; Over pressure processing

Indexed keywords

CRITICAL CURRENTS; ELECTRIC FIELDS; HEAT TREATMENT; MAGNETIC ANISOTROPY; MAGNETIC FIELDS; MAGNETIZATION; MAGNETOMETERS; MAGNETOOPTICAL DEVICES; SILVER; SQUIDS;

BI-2223 TAPE; CRITICAL CURRENT DENSITY; IRREVERSIBILITY FIELD; N VALUE; OVER PRESSURE PROCESSING;

CURRENT DENSITY;

EID: 22144481299     PISSN: 10518223     EISSN: None     Source Type: Journal    
DOI: 10.1109/TASC.2005.847512     Document Type: Conference Paper

References (5)

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