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Volumn 27, Issue 11, 2006, Pages 884-886

A micromachined electret-based transponder for in situ radiation measurement

Author keywords

Capacitive sensor; Dosimeter; Microelectromechanical system (MEMS); Microtransponder

Indexed keywords

CAPACITORS; DOSIMETERS; ELECTRIC CHARGE; GAMMA RAYS; IONIZING RADIATION; NATURAL FREQUENCIES;

EID: 33750531250     PISSN: 07413106     EISSN: None     Source Type: Journal    
DOI: 10.1109/LED.2006.884717     Document Type: Article
Times cited : (13)

References (12)
  • 6
    • 4644290318 scopus 로고    scopus 로고
    • "An implantable radiation dosimeter for use in external beam radiation therapy"
    • Sep
    • C. W. Scarantino, D. Russlander, C. J. Rini, G. G. Mann, H. T. Nagle, and R. D. Black, "An implantable radiation dosimeter for use in external beam radiation therapy," Med. Phys., vol. 31, no. 9, pp. 2658-2671, Sep. 2004.
    • (2004) Med. Phys. , vol.31 , Issue.9 , pp. 2658-2671
    • Scarantino, C.W.1    Russlander, D.2    Rini, C.J.3    Mann, G.G.4    Nagle, H.T.5    Black, R.D.6
  • 8
    • 0035892868 scopus 로고    scopus 로고
    • "A wireless batch sealed absolute capacitive pressure sensor"
    • Dec
    • O. Akar, T. Akin, and K. Najafi, "A wireless batch sealed absolute capacitive pressure sensor," Sens. Actuators A, Phys., vol. 95, no. 1, pp. 29-38, Dec. 2001.
    • (2001) Sens. Actuators A, Phys. , vol.95 , Issue.1 , pp. 29-38
    • Akar, O.1    Akin, T.2    Najafi, K.3
  • 9
    • 0003134518 scopus 로고
    • "Topics in applied physics"
    • 2nd ed, Berlin, Germany: Springer-Verlag
    • G. M. Sessler, "Topics in applied physics," in Electrets, 2nd ed, vol. 33. Berlin, Germany: Springer-Verlag, 1980, pp. 13-20.
    • (1980) Electrets , vol.33 , pp. 13-20
    • Sessler, G.M.1
  • 10
    • 33750135379 scopus 로고    scopus 로고
    • "Electret based wireless micro ionizing radiation dosimeter"
    • Istanbul, Turkey, Jan. 22-26
    • C. Son and B. Ziaie, "Electret based wireless micro ionizing radiation dosimeter," in Proc. 19th IEEE Int. Conf. Micro Electro Mech. Syst., Istanbul, Turkey, Jan. 22-26, 2006, pp. 610-613.
    • (2006) Proc. 19th IEEE Int. Conf. Micro Electro Mech. Syst. , pp. 610-613
    • Son, C.1    Ziaie, B.2
  • 12
    • 10944250519 scopus 로고    scopus 로고
    • "Kelvin probe force microscopy on corona charged oxidized semiconductor surfaces"
    • Nov
    • B. Lägel, M. D. Ayala, and R. Schlaf, "Kelvin probe force microscopy on corona charged oxidized semiconductor surfaces," Appl. Phys. Lett., vol. 85, no. 20, pp. 4801-4803, Nov. 2004.
    • (2004) Appl. Phys. Lett. , vol.85 , Issue.20 , pp. 4801-4803
    • Lägel, B.1    Ayala, M.D.2    Schlaf, R.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.