Time-of-flight photoelectron spectromicroscopy of single Mo S2 nanotubes

Journal of Applied Physics

Volumn 100, Issue 8, 2006, Pages

  Gloskovskii, A ^a   Nepijko, S A ^a   Cinchetti, M ^a   Schonhense G ^a   Fecher, G H ^a   Kandpal, H C ^a   Felser, C ^a   Therese, H A ^a   Zink, N ^a   Tremel, W ^a   Oelsner, A ^b  

^a JOHANNES GUTENBERG UNIVERSITY   (Germany)

^b SURFACE CONCEPT GMBH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

DEPOSITION; ELECTRONIC STRUCTURE; ENERGY GAP; PHOTOEMISSION; SILICON;

FEMTOSECOND LASER OSCILLATOR; PHOTOEMISSION INTENSITY; PHOTOEMISSION SPECTRA; PLANE WAVE METHOD;

NANOTUBES;

EID: 33750497501     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2359225     Document Type: Article

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