Thickness dependence of transformation characteristics of Ni-Mn-Ga thin films deposited on alumina: Experiment and modeling

Materials Science and Engineering: A

Volumn 438-440, Issue SPEC. ISS., 2006, Pages 944-947

  Chernenko, V A ^a,b   Kohl, M ^b   Ohtsuka, M ^c   Takagi, T ^c   L'vov, V A ^d   Kniazkyi, V M ^d  

^a INSTITUTE OF MAGNETISM   (Ukraine)

^b KARLSRUHE INSTITUTE OF TECHNOLOGY   (Germany)

^c TOHOKU UNIVERSITY   (Japan)

^d TARAS SHEVCHENKO NATIONAL UNIVERSITY OF KYIV   (Ukraine)

Author keywords

Alumina substrate; Martensitic transformation temperatures; Modeling; Ni Mn Ga thin films; Resistivity

Indexed keywords

ALUMINA; ANNEALING; DEPOSITION; MARTENSITIC TRANSFORMATIONS; MATHEMATICAL MODELS; MICROSTRUCTURE; TEMPERATURE; THIN FILMS;

ELASTIC INTERACTION; MARTENSITE MICROSTRUCTURE; RESISTIVITY; THICKNESS DEPENDENCE;

NICKEL ALLOYS;

ALUMINA; ANNEALING; DEPOSITION; MARTENSITIC TRANSFORMATIONS; MATHEMATICAL MODELS; MICROSTRUCTURE; NICKEL ALLOYS; TEMPERATURE; THIN FILMS;

EID: 33750456203     PISSN: 09215093     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.msea.2006.02.055     Document Type: Article

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