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Volumn 352, Issue 42-49 SPEC. ISS., 2006, Pages 4915-4919

Local fluctuations and FDR violations in aging glass

Author keywords

Atomic force and scanning tunneling microscopy; Dielectric properties; Fluctuations; Glass transition; Relaxation, electric modulus

Indexed keywords

AGING OF MATERIALS; ATOMIC FORCE MICROSCOPY; DIELECTRIC PROPERTIES; GLASS TRANSITION; SCANNING TUNNELING MICROSCOPY;

EID: 33750438486     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jnoncrysol.2006.01.150     Document Type: Article
Times cited : (6)

References (22)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.