Study of process induced variation in the minority carrier lifetime of silicon during solar cells fabrication

Materials Science and Engineering: B

Volumn 134, Issue 2-3 SPEC. ISS., 2006, Pages 287-290

  Dhungel, Suresh Kumar ^a   Yoo, Jinsu ^a   Kim, Kyunghae ^a   Ghosh, Somnath ^a   Jung, Sungwook ^a   Yi, Junsin ^a  

^a Sungkyunkwan University   (South Korea)

Author keywords

Carrier lifetime; Passivation; Silicon; Solar cell; Surface

Indexed keywords

ANTIREFLECTION COATINGS; DIFFUSION; PASSIVATION; PHOTOCONDUCTIVITY; PLASMA ETCHING; SILICON WAFERS; SURFACE PHENOMENA;

CARRIER LIFETIME; EDGE ISOLATION; MICROWAVE PHOTOCONDUCTIVE DECAY; PHOSPHORUS DIFFUSION; SURFACE PASSIVATION;

SOLAR CELLS;

EID: 33750425003     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mseb.2006.07.009     Document Type: Article

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