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Volumn 30, Issue 1, 2000, Pages 643-645

Work function change of fresh scratched silicon surface due to gas adsorption

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTRON EMISSION; GAS ADSORPTION; OXYGEN; SILICON;

EID: 0034245115     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/1096-9918(200008)30:1<643::AID-SIA747>3.0.CO;2-Z     Document Type: Article
Times cited : (2)

References (23)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.