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Volumn 49, Issue 2, 2006, Pages 220-228

Fatigue strength of BGA type solder joints between package and printed wiring board of portable device

Author keywords

Chip scale package; Fatigue; Impact strength; Pb free solder alloy; Reliability

Indexed keywords

CHIP SCALE PACKAGES; CRACK INITIATION; CRACK PROPAGATION; ELASTICITY; FATIGUE OF MATERIALS; FINITE ELEMENT METHOD; PLASTICITY; PRINTED CIRCUIT BOARDS; STRAIN; STRENGTH OF MATERIALS;

EID: 33750309137     PISSN: 13447912     EISSN: 13475363     Source Type: Journal    
DOI: 10.1299/jsmea.49.220     Document Type: Article
Times cited : (8)

References (16)
  • 1
    • 0007820763 scopus 로고    scopus 로고
    • Strength Evaluation for Brittle Failure of Intermetallic Compound Layer in Solder Joints
    • (in Japanese)
    • Yu, Q., Shiratori, M. and Kim, D., Strength Evaluation for Brittle Failure of Intermetallic Compound Layer in Solder Joints, Microjoining and Assembly Technology in Electronics 2001, (in Japanese), (2001), pp.47-53.
    • (2001) Microjoining and Assembly Technology in Electronics 2001 , pp. 47-53
    • Yu, Q.1    Shiratori, M.2    Kim, D.3
  • 2
    • 33750332158 scopus 로고    scopus 로고
    • Influence of Intermetallics in Connected Reliability of Solder Joint
    • The Japan Society of Mechanical Engineers Report of Study on Reliability for Electronics Packaging (RC181), (in Japanese)
    • The Japan Society of Mechanical Engineers, Influence of Intermetallics in Connected Reliability of Solder Joint, Report of Study on Reliability for Electronics Packaging (RC181), (in Japanese), (2000), pp.345-368.
    • (2000) , pp. 345-368
  • 4
    • 33750323804 scopus 로고    scopus 로고
    • Evaluation of Thermal Fatigue Life in BGA Solder Joint of Pb-Free
    • The Japan Society of Mechanical Engineers (in Japanese)
    • The Japan Society of Mechanical Engineers, Evaluation of Thermal Fatigue Life in BGA Solder Joint of Pb-Free, Report of Study on Reliability for Electronics Packaging (RC181), (in Japanese), (2000), pp.313-343.
    • (2000) Report of Study on Reliability for Electronics Packaging (RC181) , pp. 313-343
  • 5
    • 85009625610 scopus 로고    scopus 로고
    • Rupture Life of CSP Solder Joints with Sn-Ag Lead - Free Solders under Thermal Cycle Condition
    • (in Japanese)
    • Shoji, I., Mori, F., Fujiuchi, S. and Yamashita, M., Rupture Life of CSP Solder Joints with Sn-Ag Lead - Free Solders under Thermal Cycle Condition, Journal of Japan Institute of Electronics Packaging, (in Japanese), Vol.4, No.4 (2001), pp.289-292.
    • (2001) Journal of Japan Institute of Electronics Packaging , vol.4 , Issue.4 , pp. 289-292
    • Shoji, I.1    Mori, F.2    Fujiuchi, S.3    Yamashita, M.4
  • 8
    • 33750363908 scopus 로고    scopus 로고
    • Evaluation of Thermal Fatigue Life of Pb-Free Solder Joints for Use in Peripheral-Lead-Type LSI Packages
    • (in Japanese)
    • Terasaki, T., Nagano, K., Miura, H. and Nakatsuka, T., Evaluation of Thermal Fatigue Life of Pb-Free Solder Joints for Use in Peripheral-Lead-Type LSI Packages, Mate2001, (in Japanese), (2001), pp.441-446.
    • (2001) Mate2001 , pp. 441-446
    • Terasaki, T.1    Nagano, K.2    Miura, H.3    Nakatsuka, T.4
  • 9
    • 33750283869 scopus 로고
    • Research on Reliability of IC Package Mounted on Surface
    • Waseda Univ. Thesis for a Doctor Degree, (in Japanese)
    • Kitano, M., Research on Reliability of IC Package Mounted on Surface, Waseda Univ. Thesis for a Doctor Degree, (in Japanese), (1993).
    • (1993)
    • Kitano, M.1
  • 10
    • 33750373336 scopus 로고    scopus 로고
    • Fatigue-Strength Evaluation of Sn-Ag-Cu Solder Joints in BGA-Type Package
    • (in Japanese)
    • Terasaki, T., Nagano, K. and Saitou, N., Fatigue-Strength Evaluation of Sn-Ag-Cu Solder Joints in BGA-Type Package, JSME 2002 Annual Meeting, (in Japanese), (2002), pp.439-440.
    • (2002) JSME 2002 Annual Meeting , pp. 439-440
    • Terasaki, T.1    Nagano, K.2    Saitou, N.3
  • 11
    • 33750350982 scopus 로고    scopus 로고
    • Examination of Impact Strength of Mobile Device
    • The Japan Society of Mechanical Engineers, (in Japanese)
    • The Japan Society of Mechanical Engineers, Examination of Impact Strength of Mobile Device, Report of Study on Reliability for Electronics Packaging (RC181), (in Japanese), (2000), pp.441-489.
    • (2000) Report of Study on Reliability for Electronics Packaging (RC181) , pp. 441-489
  • 14
    • 33750330083 scopus 로고    scopus 로고
    • A Design Method of Estimating Reliability of Lead Free Solder Joints in Ball-Grid-Array-Type Package under Impact Load
    • (in Japanese)
    • Yaguchi, A., Yamada, M. and Yamamoto, K., A Design Method of Estimating Reliability of Lead Free Solder Joints in Ball-Grid-Array-Type Package under Impact Load, Journal of Japan Institute of Electronics Packaging, (in Japanese), Vol.16, No.7 (2003), pp.573-580.
    • (2003) Journal of Japan Institute of Electronics Packaging , vol.16 , Issue.7 , pp. 573-580
    • Yaguchi, A.1    Yamada, M.2    Yamamoto, K.3
  • 15
    • 0035415646 scopus 로고    scopus 로고
    • Inelastic Behavior and Fatigue Crack Initiation and Growth in Solders
    • (in Japanese)
    • Usami, S., Horino, M., Yasukawa, A. and Kanai, K., Inelastic Behavior and Fatigue Crack Initiation and Growth in Solders, Quarterly Journal of the Japan Welding Society, (in Japanese), Vol.19, No.3 (2001), pp.521-536.
    • (2001) Quarterly Journal of the Japan Welding Society , vol.19 , Issue.3 , pp. 521-536
    • Usami, S.1    Horino, M.2    Yasukawa, A.3    Kanai, K.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.