Dephasing of Bloch oscillating electrons in GaAs-based superlattices due to interface roughness scattering

Applied Physics Letters

Volumn 89, Issue 16, 2006, Pages

  Unuma, T ^a   Sekine, N ^a,b   Hirakawa, K ^a  

^a INSTITUTE OF INDUSTRIAL SCIENCE   (Japan)

^b NATIONAL INSTITUTE OF INFORMATION AND COMMUNICATIONS TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROOPTICAL DEVICES; SCATTERING; SUPERLATTICES; SURFACE ROUGHNESS; TIME DOMAIN ANALYSIS;

BLOCH OSCILLATING; DEPHASING MECHANISMS; INTERFACE ROUGHNESS; TERAHERTZ ELECTROOPTIC SAMPLING;

SEMICONDUCTING GALLIUM ARSENIDE;

EID: 33750150947     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2360911     Document Type: Article

References (16)

1. L. Esaki and R. Tsu, IBM J. Res. Dev. 14, 61 (1970).
2. N. Sekine and K. Hirakawa, Phys. Rev. Lett. 94, 057408 (2005).
3. Y. Shimada, K. Hirakawa, M. Odnoblioudov, and K. A. Chao, Phys. Rev. Lett. 90, 046806 (2003).
4. P. G. Savvidis, B. Kolasa, G. Lee, and S. J. Allen, Phys. Rev. Lett. 92, 196802 (2004).
5. H. Willenberg, G. H. Döhler, and J. Faist, Phys. Rev. B 67, 085315 (2003).
6. F. T. Vasko, Phys. Rev. B 69, 205309 (2004).
7. T. Dekorsy, R. Ott, H. Kurz, and K. Köhler, Phys. Rev. B 51, 17275 (1995).
8. N. Sekine, Y. Shimada, and K. Hirakawa, Appl. Phys. Lett. 83, 4794 (2003).
9. E. Diez, F. Domínguez-Adame, and A. Sánchez, Microelectron. Eng. 43, 117 (1998).
10. K. Leo, High-Field Transport in Semiconductor Superlattices, Springer Tracts in Modern Physics (Springer, Berlin, 2003), Vol. 187, pp. 103-117.
11. A similar time for interface roughness scattering was also obtained from transport studies on doped GaAsAlAs SLs by A. Pataǹ, A. Ignatov, L. Eaves, P. C. Main, M. Henini, E. Schomburg, R. Scheuerer, K. F. Renk, V. M. Ustinov, A. E. Zhukov, and A. R. Kovsh [Phys. Rev. B 66, 075325 (2002)].
12. T. Ando, J. Phys. Soc. Jpn. 44, 765 (1978).
13. T. Ando, A. B. Fowler, and F. Stern, Rev. Mod. Phys. 54, 437 (1982).
14. H. Sakaki, T. Noda, K. Hirakawa, M. Tanaka, and T. Matsusue, Appl. Phys. Lett. 51, 1934 (1987).
15. T. Unuma, T. Takahashi, T. Noda, M. Yoshita, H. Sakaki, M. Baba, and H. Akiyama, Appl. Phys. Lett. 78, 3448 (2001).
16. T. Unuma, M. Yoshita, T. Noda, H. Sakaki, and H. Akiyama, J. Appl. Phys. 93, 1586 (2003). In this reference, Eqs. (47)-(49) for alloy disorder scattering were mistyped and should be divided by 4; obtained numerical results are all correct.