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Volumn 11, Issue 10, 2006, Pages 489-495
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Stability testing in an integrated scheme
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Author keywords
Arrhenius model; Certified reference materials; ERM; Shelf life; Stability
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Indexed keywords
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EID: 33750149701
PISSN: 09491775
EISSN: None
Source Type: Journal
DOI: 10.1007/s00769-006-0152-6 Document Type: Article |
Times cited : (21)
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References (6)
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