-
1
-
-
0040366288
-
-
M. Ishikawa, H. Enomoto, N. Mikamoto, T. Nakamura, M. Matsuoka, and C. Iwakura, Surf. Coat. Technol., 110, 121 (1998).
-
(1998)
Surf. Coat. Technol.
, vol.110
, pp. 121
-
-
Ishikawa, M.1
Enomoto, H.2
Mikamoto, N.3
Nakamura, T.4
Matsuoka, M.5
Iwakura, C.6
-
2
-
-
0013415804
-
-
W. Bruckner, J. Schumann, S. Baunack, W. Pitschke, and T. Knuth, Thin Solid Films. 258, 236 (1995).
-
(1995)
Thin Solid Films.
, vol.258
, pp. 236
-
-
Bruckner, W.1
Schumann, J.2
Baunack, S.3
Pitschke, W.4
Knuth, T.5
-
3
-
-
28044470751
-
-
Y. Kwon, N. H. Kim, G. P. Choi, W. S. Lee, Y. J. Seo, and J. Park, Microelectron. Eng., 82, 314 (2005).
-
(2005)
Microelectron. Eng.
, vol.82
, pp. 314
-
-
Kwon, Y.1
Kim, N.H.2
Choi, G.P.3
Lee, W.S.4
Seo, Y.J.5
Park, J.6
-
4
-
-
0346356021
-
-
W. Brückner, W. Pitschke, and J. Thomas, J. Appl. Phys., 87, 2219 (2000).
-
(2000)
J. Appl. Phys.
, vol.87
, pp. 2219
-
-
Brückner, W.1
Pitschke, W.2
Thomas, J.3
-
5
-
-
16744368392
-
-
M. Obata, T. Sakuda, K. Abe, R. Hayashibe, and K. Kamimura, Surf. Coat. Technol., 180, 136 (2004).
-
(2004)
Surf. Coat. Technol.
, vol.180
, pp. 136
-
-
Obata, M.1
Sakuda, T.2
Abe, K.3
Hayashibe, R.4
Kamimura, K.5
-
6
-
-
33750093316
-
-
A. Mellberg, S. P. Nicols, N. Rorsman, and H. Zirath, Electrochem. Solid-State Lett., 5, G36 (2002).
-
(2002)
Electrochem. Solid-state Lett.
, vol.5
-
-
Mellberg, A.1
Nicols, S.P.2
Rorsman, N.3
Zirath, H.4
-
7
-
-
0038282819
-
-
R. G. Delatorre, M. L. Sartorelli, A. Q. Schervenski, and A. A. Pasa, J. Appl. Phys., 93, 6154 (2003).
-
(2003)
J. Appl. Phys.
, vol.93
, pp. 6154
-
-
Delatorre, R.G.1
Sartorelli, M.L.2
Schervenski, A.Q.3
Pasa, A.A.4
-
10
-
-
30644469403
-
-
N. D. Cuong, D. J. Kim, B. D. Kang, C. S. Kim, K. M. Yu, and S. G. Yoon, J. Electrochem. Soc., 153, G164 (2006).
-
(2006)
J. Electrochem. Soc.
, vol.153
-
-
Cuong, N.D.1
Kim, D.J.2
Kang, B.D.3
Kim, C.S.4
Yu, K.M.5
Yoon, S.G.6
-
11
-
-
13244299682
-
-
S. G. Hur, D. J. Kim, B. D. Kang, and S. G. Yoon, J. Vac. Sci. Technol. B, 22, 2698 (2004).
-
(2004)
J. Vac. Sci. Technol. B
, vol.22
, pp. 2698
-
-
Hur, S.G.1
Kim, D.J.2
Kang, B.D.3
Yoon, S.G.4
-
12
-
-
33750139945
-
-
JDCPS International Center Diffraction Data, Swarthmore, PA
-
Joint Committee for Powder Diffraction Standards, Powder Diffraction File no. 38-1420, JDCPS International Center Diffraction Data, Swarthmore, PA (1997).
-
(1997)
Powder Diffraction File No. 38-1420
, vol.98
, Issue.1420
-
-
-
15
-
-
0028194521
-
-
S. Y. Mar, J. S. Liang, C. Y. Sun, and Y. S. Huang, Thin Solid Films, 238, 158 (1994).
-
(1994)
Thin Solid Films
, vol.238
, pp. 158
-
-
Mar, S.Y.1
Liang, J.S.2
Sun, C.Y.3
Huang, Y.S.4
-
18
-
-
33744788648
-
-
N. D. Cuong, D. J. Kim, B. D. Kang, C. S. Kim, and Soon-Gil Yoon, J. Vac. Sci. Technol., B, 24, 1398 (2006).
-
(2006)
J. Vac. Sci. Technol., B
, vol.24
, pp. 1398
-
-
Cuong, N.D.1
Kim, D.J.2
Kang, B.D.3
Kim, C.S.4
Yoon, S.-G.5
-
19
-
-
0031635893
-
-
J. J. Van den Broek, J. J. M. Donkers, R. A. F. Van der Rijt, and J. T. M. Janssen, Phillips J. Res., 51, 429 (1998).
-
(1998)
Phillips J. Res.
, vol.51
, pp. 429
-
-
Van Den Broek, J.J.1
Donkers, J.J.M.2
Van Der Rijt, R.A.F.3
Janssen, J.T.M.4
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