MICROWAVE MEASUREMENT OF DIELECTRIC PROPERTIES OF LOW-LOSS MATERIALS BY THE DIELECTRIC ROD RESONATOR METHOD.

IEEE Transactions on Microwave Theory and Techniques

Volumn MTT-33, Issue 7, 1985, Pages 586-592

  Kobayashi, Yoshio ^a   Katoh, Masayuki ^a  

^a SAITAMA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

MATERIALS - DIELECTRIC PROPERTIES; MATHEMATICAL TECHNIQUES - APPROXIMATION THEORY; MEASUREMENT ERRORS; RESONATORS - APPLICATIONS; TEMPERATURE MEASUREMENT - COMPUTER APPLICATIONS;

DIELECTRIC ROD RESONATOR; ERROR ESTIMATION OF MEASURED VALUES; LOSS TANGENT; LOW-LOSS MATERIALS; PARALLEL CONDUCTING PLATES SHORT-CIRCUIT;

MICROWAVE MEASUREMENTS;

EID: 0022100780     PISSN: 00189480     EISSN: None     Source Type: Journal    
DOI: 10.1109/tmtt.1985.1133033     Document Type: Article

References (12)