CMOS-ESPI-system with in-line digital phase stabilization using unresolved speckles

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4777, Issue , 2002, Pages 232-241

  Helmers, Heinz ^a   Carl, Daniel ^a   Sievers, Thorsten ^a  

^a UNIVERSITY OF OLDENBURG   (Germany)

Author keywords

CMOS sensors; Electronic speckle pattern interferometry (ESPI); Phase stabilization; Unresolved speckles

Indexed keywords

CAMERAS; CMOS INTEGRATED CIRCUITS; DIGITAL SIGNAL PROCESSING; HETERODYNING; PHASE CONTROL; PHASE SHIFT; SENSORS; SPECKLE;

DIGITAL PHASE STABILIZATION; ELECTRONIC SPECKLE PATTERN INTERFEROMETRY (ESPI);

INTERFEROMETRY;

EID: 0036421252     PISSN: 0277786X     EISSN: None     Source Type: Journal    
DOI: 10.1117/12.472224     Document Type: Article

References (5)

1. Creath, K.: Temporal Phase Measurement Methods, in: Robinson, D.W.; Reid, G.T. [Eds.]: Interferogram Analysis, Institute of Physics Publishing, Bristol, 1993, pp. 94-140.
2. Burke, J.; Helmers, H.; Kunze, C.; Wilkens, V.: Speckle intensity and phase gradients: influence on fringe quality in spatial phase shifting ESPI-systems, Opt. Commun. 151.1-3 (1998) 144-152.
3. Brozeit, A.; Burke, J.; Helmers, H.: Active phase stabilisation in electronic speckle pattern interferometry without additional optical components, Opt. Commun. 173.1-6 (2000) 95-100.
4. Helmers, H.; Bischoff, M.; Ehlkes, L.: ESPI-system with active in-line digital phase stabilization, in: Proc. FRINGE '01 (4th Intern. Workshop on Automatic Processing of Fringe Patterns, Bremen, 17. - 19. 9. 2001), 2001, Elsevier, Paris, 673-679.
5. Lehmann, M.: Phase-shifting speckle interferometry with unresolved speckles: A theoretical investigation, Opt. Commun. 128 (1996) 325-340.