Optimizing imaging polarimeters constructed with imperfect optics

Applied Optics

Volumn 45, Issue 22, 2006, Pages 5497-5503

  Tyo, J Scott ^a,b   Wei, Hua ^a,b  

^a University of New Mexico   (United States)

^b UNIVERSITY OF ARIZONA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATTENUATION; ELECTROMAGNETIC WAVE POLARIZATION; IMAGING TECHNIQUES; OPTICAL PROPERTIES; OPTIMIZATION; SIGNAL TO NOISE RATIO;

EXTINCTION RATIOS; IMAGING POLARIMETERS; INCIDENCE ANGLE;

POLARIMETERS;

EID: 33749840761     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.45.005497     Document Type: Article

References (31)

1. R. Walraven, "Polarization imagery," Opt. Eng. 20, 14-18 (1981).
2. L. B. Wolff, "Surface orientation from polarization images," in Optics, Illumination, and Image Sensing for Machine Vision II, D. J. Svetkoff, ed., Proc. SPIE 850, 110-121 (1987).
3. L. B. Wolff and T. E. Boult, "Constraining object features using a polarization reflectance model," IEEE Trans. Pattern Anal. Mach. Intell. 13, 635-657 (1991).
4. G. D. Lewis, D. L. Jordan, and E. Jakeman, "Backscatter linear and circular polarization analysis of roughened aluminum," Appl. Opt. 37, 5985-5992 (1998).
5. J. S. Tyo and T. S. Turner, "Variable retardance, Fourier transform imaging spectropolarimeters for visible spectrum remote sensing," Appl. Opt. 40, 1450-1458 (2001).
6. W. G. Egan, W. R. Johnson, and V. S. Whitehead, "Terrestrial polarization imagery obtained from the space shuttle: characterization and interpretation," Appl. Opt. 30, 435-442 (1991).
7. R. A. Chipman, "Polarimetry," in Handbook of Optics, M. Bass, ed. (McGraw-Hill, 1995), Vol. 2, Chap. 2.
8. A. Ambirajan and D. C. Look, "Optimum angles for a polarimeter: part I," Opt. Eng. 34, 1651-1655 (1995).
9. A. Ambirajan and D. C. Look, "Optimum angles for a polarimeter: part II," Opt. Eng. 34, 1656-1659 (1995).
10. V. A. Dlugunovich, V. N. Snopko, and A. V. Tsaruk, "Minimizing the measurement error of the stokes parameters when the setting angles of a phase plate are varied," J. Opt. Technol. 67, 797-800 (2000).
11. D. S. Sabatke, M. R. Descour, E. Dereniak, W. C. Sweatt, S. A. Kemme, and G. S. Phipps, "Optimization of retardance for a complete Stokes polarimeter," Opt. Lett. 25, 802-804 (2000).
12. J. S. Tyo, "Design of optimal polarimers: maximization of signal-to-noise ratio and minimization of systematic error," Appl. Opt. 41, 619-630 (2002).
13. P. Li and J. S. Tyo, "Experimental measurement of optimal polarimeter systems," in Polarization Science and Remote Sensing, J. A. Shaw and J. S. Tyo, eds., Proc. SPIE 5158, 103-112 (2003).
14. L. B. Wolff, "Polarization camera for computer vision with a beam splitter," J. Opt. Soc. Am. A 11, 2935-2945 (1994).
15. D. C. Dayton, B. G. Hoover, and J. D. Gonglewski, "Full-order Mueller matrix polarimeter using liquid-crystal variable retarders," in Optics in Atmospheric Propagation and Adaptive Systems V, A. Kohnle and J. D. Gonglewski, eds., Proc. SPIE 4884, 40-48 (2003).
16. C. K. Harnett and H. G. Craighead, "Liquid-crystal micropolarizer for polarization-difference imaging," Appl. Opt. 41, 1291-1296 (2002).
17. Meadowlark Optics, Boulder, Colo., Liquid Crystal Variable Retarder, http://www.meadowlark.com/.
18. D. B. Chenault and R. A. Chipman, "Infrared birefringence spectra for cadmium sulfide and cadmium selenide," Appl. Opt. 32, 4223-4227 (1993).
19. N. J. Pust and J. A. Shaw, "Dual-field imaging polarimeter for studying the effect of clouds on sky and target polarization," in Polarization Science and Remote Sensing II, J. A. Shaw and J. S. Tyo, eds., Proc. SPIE 5888, 295-303 (2005).
20. N. A. Beaudry, Y. Zhao, and R. Chipman, "Multi-angle generalized ellipsometry of anisotropic optical structures," in Polarization Science and Remote Sensing II, J. A. Shaw and J. S. Tyo, eds., Proc. SPIE 5888, 61-71 (2005).
21. G. P. Nordin, J. T. Meier, P. C. Deguzman, and M. Jones, "Diffractive optical element for Stokes vector measurement with a focal plane array," in Polarization Measurement, Analysis, and Remote Sensing II, D. H. Goldstein and D. B. Chenault, eds., Proc. SPIE 3754, 169-177 (1999).
22. J. K. Boger, J. S. Tyo, B. M. Ratliff, M. P. Fetrow, W. Black, and R. Kumar, "Modeling precision and acuracy of a LWIR microgrid array imaging polarimeter," in Polarization Science and Remote Sensing II, J. A. Shaw and J. S. Tyo, eds., Proc. SPIE 5888, 227-238 (2005).
23. R. M. A. Azzam and N. M. Bashara, Ellipsometry and Polarized Light (North-Holland, 1977).
24. R. M. A. Azzam, "Photopolarimetric measurement of the Mueller matrix by Fourier analysis of a single detected signal," Opt. Lett. 2, 48-50 (1977).
25. R. M. A. Azzam, I. M. Elminyawi, and A. M. El-Saba, "General analysis and optimization of the four-detector photopolarimeter," J. Opt. Soc. Am. A 5, 681-689 (1988).
26. C. A. Farlow, D. B. Chenault, K. D. Spradley, M. G. Gulley, M. W. Jones, and C. M. Persons, "Automated registration of polarimetric imagery using fourier transform techniques," in Polarization Measurement, Analysis, and Remote Sensing IV, D. B. Chenault and D. H. Goldstein, eds., Proc. SPIE 4819, 107-117 (2002).
27. V. L. Gamiz and J. F. Belsher, "Performance limitations of a four-channel polarimeter in the presence of detection noise," Opt. Eng. 41, 973-980 (2002).
28. S.-Y. Lu and R. A. Chipman, "Interpretation of Mueller matrices based on the polar decomposition," J. Opt. Soc. Am. A 13, 1106-1113 (1996).
29. J. S. Tyo, "Noise equalization in Stokes parameter images obtained by use of variable retardance polarimeters," Opt. Lett. 25, 1198-2000 (2000).
30. M. H. Smith, J. B. Woodruff, and J. D. Howe, "Beam wander considerations in imaging polarimetry," in Polarization Measurement, Analysis, and Remote Sensing II, D. H. Goldstein and D. B. Chenault, eds., Proc. SPIE 3754, 50-54 (1999).
31. S. H. Sposato, M. P. Fetrow, K. P. Bishop, and T. R. Caudill, "Two long-wave infrared spectral polarimeters for use in remote sensing applications," Opt. Eng. 41, 1055-1064 (2002).