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Volumn 13, Issue 13, 2006, Pages 857-861

Granger causality test on R&D spatial spillovers and productivity growth

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONICS INDUSTRY; GRANGER CAUSALITY TEST; PANEL DATA; PRODUCTIVITY; RESEARCH AND DEVELOPMENT; SPILLOVER EFFECT;

EID: 33749656811     PISSN: 13504851     EISSN: 14664291     Source Type: Journal    
DOI: 10.1080/13504850500425360     Document Type: Article
Times cited : (11)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.