X-ray diffraction peaks at glancing incidence and glancing exit from highly mismatched epitaxial layers

Applied Physics Letters

Volumn 89, Issue 2, 2006, Pages

  Kaganer, V M ^a   Shalimov, A ^b   Bak Misiuk, J ^b   Ploog, K H ^a  

^a PAUL DRUDE INSTITUT FÜR FESTKÖRPERELEKTRONIK   (Germany)

^b INSTITUTE OF PHYSICS   (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

DOUBLE CRYSTALS; EPITAXIAL LAYERS; HETEROEPITAXIAL SYSTEMS; RECIPROCAL DIFFRACTION GEOMETRIES;

COMPUTATIONAL GEOMETRY; DETECTORS; ELECTRODYNAMICS; ELECTROMAGNETIC WAVE SCATTERING; GALLIUM COMPOUNDS; X RAY DIFFRACTION ANALYSIS;

REFLECTION;

EID: 33749625273     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2221885     Document Type: Article

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