Low noise, low power readout electronics circuit development in standard CMOS technology for 4 K applications

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 6275, Issue , 2006, Pages

  Merken, Patrick ^a,b   Souverijns, Tim ^a   Putzeys, Jan ^a   Creten, Ybe ^a   Van Hoof, Chris ^a  

^a IMEC   (Belgium)

^b ROYAL MILITARY ACADEMY   (Belgium)

Author keywords

CMOS; Cryogenic; Far infrared; LHT; ROIC

Indexed keywords

FAR-INFRARED; LHT; ROIC;

CMOS INTEGRATED CIRCUITS; CRYOGENICS; ELECTRIC PROPERTIES; ENERGY UTILIZATION; FLIP CHIP DEVICES; INFRARED DETECTORS;

NETWORKS (CIRCUITS);

EID: 33749600436     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.669972     Document Type: Conference Paper

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