Effect of Cu migration in a field induced dielectric failure

Materials Research Society Symposium Proceedings

Volumn 914, Issue , 2006, Pages 331-337

  Hwang, Sang Soo ^a   Jung, Sung Yup ^a   Joo, Young Chang ^a  

^a Seoul National University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; COMPUTER SYSTEM RECOVERY; DIELECTRIC MATERIALS; ELECTROMIGRATION; FREQUENCY DIVISION MULTIPLEXING; MATHEMATICAL MODELS;

E MODEL; METAL-INSULATOR-SEMICONDUCTOR (MIS); SPACE-CHARGE EFFECT; TIME-DEPENDENT DIELECTRIC BREAKDOWN (TDDB);

COPPER;

EID: 33749593186     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-0914-f06-07     Document Type: Conference Paper

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