The TOF-strain scanner POLDI with multiple frame overlap-concept and performance

Materials Science and Engineering: A

Volumn 437, Issue 1, 2006, Pages 134-138

  Stuhr, U ^a   Grosse, M ^a   Wagner, W ^a  

^a PAUL SCHERRER INSTITUTE   (Switzerland)

Author keywords

Neutron diffraction; Residual stress; Strain scanner; Time of flight diffractometer

Indexed keywords

COMPUTATIONAL METHODS; DIFFRACTOMETERS; RESIDUAL STRESSES; STRAIN; STRAIN MEASUREMENT;

RESIDUAL STRESS MEASUREMENTS; STRAIN SCANNER; TIME-OF-FLIGHT DIFFRACTOMETER;

NEUTRON DIFFRACTION;

COMPUTATIONAL METHODS; DIFFRACTOMETERS; NEUTRON DIFFRACTION; RESIDUAL STRESSES; STRAIN; STRAIN MEASUREMENT;

EID: 33749562581     PISSN: 09215093     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.msea.2006.04.069     Document Type: Article

References (4)

1. Hiismäki P. Neutron inelastic scattering. Conf. Proc. Vienna, IAEA (1972) 429
2. Cockcroft J.K., and Kearley G.J. J. Appl. Cryst. 17 (1984) 464
3. Stuhr U. Physica B 241-243 (1998) 224
4. Stuhr U. Nucl. Instrum. Methods A 545 (2005) 319