Improved methodology for better accuracy on transistors matching characterization

IEEE International Conference on Microelectronic Test Structures

Volumn 2006, Issue , 2006, Pages 173-178

  Cathignol, Augustin ^a,b   Rochereau, Krysten ^c   Bordez, Samuel ^a   Ghibaudo, Gérard ^b  

^a STMICROELECTRONICS   (France)

^b IMEP LAHC   (France)

^c NXP SEMICONDUCTORS   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT MISMATCH; DISPERSION ESTIMATION; LEAST SQUARES REGRESSION;

ELECTRONIC EQUIPMENT TESTING; MATHEMATICAL MODELS; MOSFET DEVICES; PARAMETER ESTIMATION; REGRESSION ANALYSIS;

BIPOLAR TRANSISTORS;

EID: 33749523713     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICMTS.2006.1614298     Document Type: Conference Paper

References (11)

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