Progress in semiconductor spectroscopy using isotopically enriched Si

AIP Conference Proceedings

Volumn 772, Issue , 2005, Pages 67-68

  Thewalt, M L W ^a   Meyer, T A ^a   Karaiskaj, D ^a   Cardona, M ^b   Haller, E E ^c,d   Ager III, J W ^c   Riemann, H ^e  

^a SIMON FRASER UNIVERSITY   (Canada)

^b MAX PLANCK INSTITUT FÜR FESTKÖRPERFORSCHUNG   (Germany)

^c LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^d University of California Berkeley   (United States)

^e LEIBNIZ INSTITUTE FOR CRYSTAL GROWTH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 33749479131     PISSN: 0094243X     EISSN: 15517616     Source Type: Conference Proceeding    
DOI: 10.1063/1.1993998     Document Type: Conference Paper

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