Investigation of the interface roughness of GaAs single quantum wells by X-ray diffractometry, reflectivity and diffuse scattering

Nuovo Cimento della Societa Italiana di Fisica D - Condensed Matter, Atomic, Molecular and Chemical Physics, Biophysics

Volumn 19, Issue 2-4, 1997, Pages 429-438

  Jenichen, B ^a   Hey, R ^a   Wassermeier, M ^a   Ploog, K ^a  

^a Paul Dmde Institut für Festkörperelektronik   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 33749445647     PISSN: 03926737     EISSN: None     Source Type: Journal    
DOI: 10.1007/BF03041002     Document Type: Article

References (22)

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