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Volumn , Issue , 2005, Pages 175-178

Secondary neutron fluence in radiation test beams at the northeast proton therapy center

Author keywords

[No Author keywords available]

Indexed keywords

CHARACTERIZATION; RADIATION EFFECTS;

EID: 33749380839     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/REDW.2005.1532686     Document Type: Conference Paper
Times cited : (4)

References (9)
  • 1
    • 0029732375 scopus 로고    scopus 로고
    • IBM experiments in soft fails in computer eleotronios,(1978-1994)
    • J. F. Ziegler, et al "IBM Experiments in Soft Fails in Computer Eleotronios,(1978-1994)" IBM J. Res. Development, vol 40, no. 1 pp3-18 (1996)
    • (1996) IBM J. Res. Development , vol.40 , Issue.1 , pp. 3-18
    • Ziegler, J.F.1
  • 4
    • 0012260563 scopus 로고    scopus 로고
    • Neutron-induced boron fission as a major source of soft errors in deep submicron SRAM devices
    • R. C. Baumann and E. B. Smith, "Neutron-Induced Boron Fission as a Major Source of Soft Errors in Deep Submicron SRAM Devices", IEEE Proc. IRPS, p. 297, (2000)
    • (2000) IEEE Proc. IRPS , pp. 297
    • Baumann, R.C.1    Smith, E.B.2
  • 7
    • 33749412393 scopus 로고    scopus 로고
    • Personal communication
    • R. Stevens, Personal communication
    • Stevens, R.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.