Local environment surrounding S and Cd in CdS:O thin film photovoltaic materials probed by x-ray absorption fine structures

Applied Physics Letters

Volumn 89, Issue 13, 2006, Pages

  Soo, Y L ^a   Sun, W H ^a   Weng, S C ^a   Lin, Y S ^a   Chang, S L ^a   Jang, L Y ^b   Wu, X ^c   Yan, Y ^c  

^a NATIONAL TSING HUA UNIVERSITY   (Taiwan)

^b NATIONAL SYNCHROTRON RADIATION RESEARCH CENTER   (Taiwan)

^c NATIONAL RENEWABLE ENERGY LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BAND ANTICROSSING MODEL; EXTENDED X-RAY ABSORPTION FINE STRUCTURE (EXAFS); PHOTOVOLTAIC MATERIALS;

COMPLEXATION; LIGHT ABSORPTION; NANOSTRUCTURED MATERIALS; PHOTOVOLTAIC EFFECTS; SULFUR COMPOUNDS; TRANSMISSION ELECTRON MICROSCOPY;

THIN FILMS;

EID: 33749244916     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2356995     Document Type: Article

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