Uncertainty of residual stresses measurement by layer removal

International Journal of Mechanical Sciences

Volumn 48, Issue 12, 2006, Pages 1429-1438

  Bendek, E ^a   Lira, I ^a   Francois M ^b   Vial, C ^a  

^a PONTIFICIA UNIVERSIDAD CATÓLICA DE CHILE   (Chile)

^b UNIVERSITÉ DE TECHNOLOGIE DE TROYES   (France)

Author keywords

ESPI; Layer removal; Residual stresses; Uncertainty

Indexed keywords

ETCHING; INTERFEROMETRY; PHASE SHIFT; POLYNOMIALS; STRESS ANALYSIS; STRESS CONCENTRATION; THICKNESS CONTROL; UNCERTAIN SYSTEMS; X RAY DIFFRACTION;

CHEMICAL ETCHING; LAYER REMOVAL; THIN LAYERS; UNCERTAINTY;

RESIDUAL STRESSES;

EID: 33749236595     PISSN: 00207403     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ijmecsci.2006.07.002     Document Type: Article

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