X-ray Raman scattering at the L edges of elemental Na, Si, and the N edge of Ba in Ba8Si46

Physical Review B - Condensed Matter and Materials Physics

Volumn 72, Issue 3, 2005, Pages

  Sternemann, C ^a   Soininen, J A ^b   Huotari, S ^c   Vanko G ^c   Volmer, M ^a   Secco, R A ^d   Tse, J S ^e   Tolan, M ^a  

^a TU DORTMUND UNIVERSITY   (Germany)

^b UNIVERSITY OF HELSINKI   (Finland)

^c EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^d UNIVERSITY OF WESTERN ONTARIO   (Canada)

^e UNIVERSITY OF SASKATCHEWAN   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 33749158637     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.72.035104     Document Type: Article

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