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Volumn 600, Issue 18, 2006, Pages 4155-4159

Thickness dependence of magnetic domains of MnAs films

(3) Manago, T a Kuramochi, H a,b Akinaga, H a

a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST (Japan)

Author keywords

Atomic force microscopy; Gallium arsenide; Magnetic force microscopy; Manganese arsenide; Metal semiconductor magnetic thin film structures

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYSTALLINE MATERIALS; MAGNETIC ANISOTROPY; MAGNETIC DOMAINS; MAGNETIZATION; MANGANESE COMPOUNDS; REMANENCE; SEMICONDUCTING GALLIUM ARSENIDE; THICKNESS MEASUREMENT;

MAGNETIC FORCE MICROSCOPY (MFM); MANGANESE ARSENIDE; METAL-SEMICONDUCTOR MAGNETIC THIN FILM STRUCTURES; ROOM TEMPERATURE;

SEMICONDUCTING FILMS;

EID: 33748945707 PISSN: 00396028 EISSN: None Source Type: Journal
DOI: 10.1016/j.susc.2006.01.137 Document Type: Article

Times cited : (11)

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