Magnetic pole pinning at rectangular defects on MnAs/GaAs(0 0 1)

Surface Science

Volumn 550, Issue 1-3, 2004, Pages 192-198

  Kuramochi, H ^a,b   Okabayashi, J ^a,c   Takano, F ^a   Mizuguchi, M ^a   Manago, T ^a   Akinaga, H ^a  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

^b SEIKO INSTRUMENTS INC   (Japan)

^c UNIVERSITY OF TOKYO   (Japan)

Author keywords

Arsenic; Atomic force microscopy; Gallium arsenide; Magnetic measurements; Magnetic phenomena (cyclotron resonance, phase transitions, etc.); Manganese; Metal semiconductor magnetic thin film structures

Indexed keywords

ARSENIC; ATOMIC FORCE MICROSCOPY; CRYSTAL STRUCTURE; CYCLOTRON RESONANCE; FERROMAGNETIC MATERIALS; GALLIUM COMPOUNDS; MAGNETIC ANISOTROPY; MAGNETIC DOMAINS; MAGNETIC FIELDS; MAGNETIC THIN FILMS; MAGNETIC VARIABLES MEASUREMENT; MAGNETIZATION; PHASE TRANSITIONS; SUBSTRATES; THERMAL EFFECTS; THICKNESS MEASUREMENT;

MAGNETIC PHENOMENA; SEMICONDUCTOR MAGNETIC FILMS; THIN FILM STRUCTURES;

MANGANESE COMPOUNDS;

EID: 0942267861     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2003.12.024     Document Type: Article

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