Electron reflectivity measurements of Ag adatom concentrations on W(1 1 0)

Surface Science

Volumn 600, Issue 18, 2006, Pages 4062-4066

  de la Figuera, J ^a   Bartelt, N C ^b   McCarty, K F ^b  

^a CENTRO DE MICROANÁLISIS DE MATERIALES   (Spain)

^b SANDIA NATIONAL LABORATORIES   (United States)

Author keywords

Ag; Electron reflectivity; Leem; Low energy electron microscopy; Phase transitions; Sublimation; Thin films; W

Indexed keywords

CONDENSATION; CRYSTALLINE MATERIALS; ELECTRON MICROSCOPY; ELECTRON REFLECTION; HIGH TEMPERATURE OPERATIONS; PHASE TRANSITIONS; SUBLIMATION; THIN FILMS; TUNGSTEN;

ADATOMS; CONCENTRATION MEASUREMENT; LOW-ENERGY ELECTRON MICROSCOPY (LEEM); SUBLIMATION RATE;

SILVER;

EID: 33748944824     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2006.02.069     Document Type: Article

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