The effect of substrate surface on the physical properties of SnS films

Semiconductor Science and Technology

Volumn 21, Issue 10, 2006, Pages 1495-1501

  Devika, M ^a   Koteeswara Reddy, N ^b   Ramesh, K ^b   Sumana, H R ^b   Gunasekhar, K R ^b   Gopal, E S R ^b   Ramakrishna Reddy, K T ^a  

^a SRI VENKATESWARA UNIVERSITY   (India)

^b INDIAN INSTITUTE OF SCIENCE   (India)

Author keywords

[No Author keywords available]

Indexed keywords

COATED MATERIALS; CRYSTAL STRUCTURE; ELECTRIC CONDUCTIVITY; OPTOELECTRONIC DEVICES; SEMICONDUCTING TIN COMPOUNDS; SILICON; STOICHIOMETRY;

ORTHORHOMBIC CRYSTALLINE STRUCTURE; THE RESISTIVE THERMAL EVAPORATION METHOD; TIN MONO-SULPHIDE (SNS) FILMS;

METALLIC FILMS;

EID: 33748874927     PISSN: 02681242     EISSN: 13616641     Source Type: Journal    
DOI: 10.1088/0268-1242/21/10/024     Document Type: Article

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