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Physical Review Letters

Volumn 97, Issue 12, 2006, Pages

Generalized electron counting in determination of metal-induced reconstruction of compound semiconductor surfaces

(5) Zhang, Lixin a Wang, E G a Xue, Q K a Zhang, S B b Zhang, Zhenyu c,d

a INSTITUTE OF PHYSICS (China)

b NATIONAL RENEWABLE ENERGY LABORATORY (United States)

c OAK RIDGE NATIONAL LABORATORY (United States)

d UNIVERSITY OF TENNESSEE (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONS; MATHEMATICAL MODELS; METAL ANALYSIS;

COMPOUND SEMICONDUCTORS; GENERALIZED ELECTRON COUNTING (GEC); METAL ADSORBATES; THEORETICAL ANALYSIS;

SEMICONDUCTOR MATERIALS;

EID: 33748786769 PISSN: 00319007 EISSN: 10797114 Source Type: Journal
DOI: 10.1103/PhysRevLett.97.126103 Document Type: Article

Times cited : (58)

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