Statistical characterization of surface morphologies

Physica A: Statistical Mechanics and its Applications

Volumn 371, Issue 2, 2006, Pages 361-367

  Atanasov, I S ^a   Durrell, J H ^b   Vulkova, L A ^a   Barber, Z H ^b   Yordanov, O I ^a,c  

^a INSTITUTE OF ELECTRONICS   (Bulgaria)

^b UNIVERSITY OF CAMBRIDGE   (United Kingdom)

^c AMERICAN UNIVERSITY IN BULGARIA   (Bulgaria)

Author keywords

AFM images; Statistical characterization of surfaces; Surface anisotropy; Surface growth

Indexed keywords

ANISOTROPY; ATOMIC FORCE MICROSCOPY; COMPUTER SIMULATION; CORRELATION METHODS; FUNCTIONS; STATISTICAL MECHANICS; STATISTICAL METHODS;

STATISTICAL CHARACTERIZATION OF SURFACES; SURFACE ANISOTROPY; SURFACE GROWTH;

SURFACE ROUGHNESS;

EID: 33748785443     PISSN: 03784371     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.physa.2006.04.013     Document Type: Article

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