Structural properties of films grown by magnetron sputtering of a BiFeO3 target

Thin Solid Films

Volumn 515, Issue 2 SPEC. ISS., 2006, Pages 481-484

  Ternon, C ^a   Thery, J ^a   Baron, T ^a   Ducros, C ^b   Sanchette, F ^b   Kreisel, J ^c  

^a Joseph Fourier University   (France)

^b CEA GRENOBLE   (France)

^c LABORATOIRE DES MATÉRIAUX ET DU GÉNIE PHYSIQUE   (France)

Author keywords

BiFeO3; Microstructure; Spin phonon coupling; Sputtering

Indexed keywords

AMORPHOUS FILMS; ANNEALING; CRYSTALLIZATION; FILM GROWTH; FOURIER TRANSFORM INFRARED SPECTROSCOPY; HIGH RESOLUTION ELECTRON MICROSCOPY; MAGNETRON SPUTTERING; MICROSTRUCTURE; RAMAN SPECTROSCOPY; SILICON; THIN FILMS; X RAY DIFFRACTION;

BIFEO3; DEPOSITION-TEMPERATURE; SPIN-PHONON COUPLING; STRUCTURAL PROPERTIES;

BISMUTH COMPOUNDS;

EID: 33748770343     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2005.12.267     Document Type: Article

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