Multilayers with tailored blurred interfaces

Applied Physics Letters

Volumn 89, Issue 11, 2006, Pages

  Padiyath, J ^a   Stahn, J ^a   Horisberger, M ^a   Boni, P ^b  

^a PAUL SCHERRER INSTITUTE   (Switzerland)

^b TECHNICAL UNIVERSITY OF MUNICH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; DIFFUSION; INTERFACES (MATERIALS); MAGNETRON SPUTTERING; MONOCHROMATORS; X RAY DIFFRACTION ANALYSIS;

DC-MAGNETRON SPUTTERING; FIRST-ORDER REFLECTIVITY; INTERDIFFUSION;

MULTILAYERS;

EID: 33748759839     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2355364     Document Type: Article

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