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Volumn 86, Issue 33-35 SPEC. ISSUE, 2006, Pages 5729-5737
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Optical indentation microscopy - A new family of instrumented indentation testing
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Author keywords
[No Author keywords available]
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Indexed keywords
CHARGE COUPLED DEVICES;
HYSTERESIS;
INDENTATION;
OPTICAL INSTRUMENT LENSES;
PARAMETER ESTIMATION;
VIDEO CAMERAS;
HYSTERESIS CURVE;
INDENTATION TESTING;
OPTICAL INDENTATION MICROSCOPY;
OPTICAL MICROSCOPY;
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EID: 33748757891
PISSN: 14786435
EISSN: 14786443
Source Type: Journal
DOI: 10.1080/14786430600788947 Document Type: Conference Paper |
Times cited : (28)
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References (16)
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