Effects of stress, temperature and annealing conditions on the transport properties of amorphous wires

Journal of Magnetism and Magnetic Materials

Volumn 226-230, Issue , 2001, Pages 715-717

  Milne, J ^a   Gore, J ^a   Tomka, G ^a   Skull, P ^a  

^a DEFENCE SCIENCE AND TECHNOLOGY LABORATORY   (United Kingdom)

Author keywords

Amorphous systems; Annealing; Magneto impedance; Metallic glasses; Stress

Indexed keywords

AMBIENT TEMPERATURES; AMORPHOUS SYSTEMS; AMORPHOUS WIRE; ANNEALING CONDITION; AVERAGE STRESS; ELEVATED TEMPERATURE; FURNACE ANNEALING; GIANT MAGNETOIMPEDANCE; MAGNETO-IMPEDANCE; MAGNETOELASTIC ANISOTROPY; OPTIMISATIONS;

COBALT COMPOUNDS; GLASS; MAGNETIC FIELDS; MAGNETOS; METALLIC GLASS; SYSTEMS (METALLURGICAL); TRANSPORT PROPERTIES; WIRE;

ANNEALING;

EID: 33748695071     PISSN: 03048853     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-8853(00)01147-1     Document Type: Article

References (5)

1. L.P. Shen, T. Uchiyama, K. Mohri, E. Kita, K. Bushida, IEEE Trans. Magn. 33 (1997) 3355.
2. M. Knobel, M. Vazquez, M. Sanchez, A. Hernando, J. Magn. Magn. Mater. 169 (1997) 89-97.
3. L.V. Panina, K. Mohri, Appl. Phys. Lett. 65 (1994) 1189.
4. Patent for Integrating Magnetic Sensor, patent number WO D GB99/01967 (Pending).
5. J. Gore, G. Tomka, J. Milne, M. Maylin, P. Squire, D. Atkinson, oral presentation, at Materials Research Meeting, San Francisco, 5-9 April 1999, published in Symposium Proceedings.