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Volumn 8, Issue 8, 2006, Pages 719-723
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Three dimensional characterization of unmodified and Sr-modified Al-Si eutectics by FIB and FIB EDX tomography
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Author keywords
[No Author keywords available]
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Indexed keywords
ALUMINUM ALLOYS;
ENERGY DISPERSIVE SPECTROSCOPY;
GRAIN BOUNDARIES;
IMAGE SEGMENTATION;
ION BEAMS;
MICROSTRUCTURE;
STRONTIUM;
ELECTRON IMAGING;
EUTECTIC STRUCTURE;
FOCUSED ION BEAM (FIB);
PLATINUM LAYERS;
EUTECTICS;
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EID: 33748578322
PISSN: 14381656
EISSN: 15272648
Source Type: Journal
DOI: 10.1002/adem.200500276 Document Type: Article |
Times cited : (38)
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References (13)
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