Orientation changes inside shear bands occurring in channel-die compressed (112)[111] copper single crystals

Scripta Materialia

Volumn 35, Issue 3, 1996, Pages 397-403

  Jasienski, Z ^a   Baudin, T ^b   Piatkowski, A ^a   Penelle, R ^b  

^a POLISH ACADEMY OF SCIENCES   (Poland)

^b UNIVERSITÉ PARIS SACLAY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CHARACTERIZATION; COMPRESSION TESTING; COPPER; CRYSTAL GROWTH; CRYSTAL ORIENTATION; DIES; ELECTROLYTIC POLISHING; METALLOGRAPHY; STRAIN; TEXTURES; TRANSMISSION ELECTRON MICROSCOPY; WEAR OF MATERIALS;

BRIDGMAN TECHNIQUE; CHANNEL DIE COMPRESSED COPPER SINGLE CRYSTALS; COPLANAR SLIP SYSTEMS; ELECTRON BACK SCATTERING DIFFRACTION TECHNIQUE; MACROSCOPIC SHEAR BANDS; OCTAHEDRAL SLIP PLANE; ORIENTATION SCATTERING;

SINGLE CRYSTALS;

EID: 0030216750     PISSN: 13596462     EISSN: None     Source Type: Journal    
DOI: 10.1016/1359-6462(96)00159-5     Document Type: Article

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