A new method to examine interfacial reactions of a multilayered system NiAl-Hf-hBN on a sapphire fibre

Microchimica Acta

Volumn 155, Issue 1-2, 2006, Pages 257-262

  Richter, Silvia ^a   Kyrsta, Stepan ^a   Schneider, Jochen ^a   Hajas, David ^a   Mayer, Joachim ^a  

^a RWTH AACHEN UNIVERSITY   (Germany)

Author keywords

Electron probe microanalysis; Fibre matrix composite; Focused ion beam; Multilayered structure; Quantitative depth profiling

Indexed keywords

EID: 33748554204     PISSN: 00263672     EISSN: 14365073     Source Type: Journal    
DOI: 10.1007/s00604-006-0552-7     Document Type: Conference Paper

References (9)

1. Bowman R, Misra A K, Arnold S M (1995) Metall Mat Trans A 26A: 615
2. Bowman R (1992) Mat Res Soc Symp Proc 273: 145
3. Tewari S N, Asthana R, Tiwari R, Bowman R, Smith J (1995) Metall Mat Trans A 26A: 477
4. Reichert K, Wen K, Cremer R, Hu W, Neuschütz D, Gottstein G (2001) Appl Surf Sci 179: 151
5. Pouchou J L, Pichoir F (1984) Recherche Aerospaciale 5: 47
6. Lesch N, Richter S, Karduck P (1998) Microchim Acta 15: 133
7. Ammann N, Karduck P (1990) Microbeam analysis. In: Michael J R, Ingram P (eds) San Francisco Press, San Francisco, p 150
8. Richter S, Kyrsta S, Aretz A, Bückins M, Spähn M, Mayer J (2004) Microchim Acta 145: 187
9. Jansson B (1984) Evaluation of parameters in thermochemical models using different types of experimental data simulaneously. Ph.D. Thesis, Div. of Phys. Met., Royal Inst. of Technology, Stockholm, Sweden